The 31st annual pattern recognition symposium of the German Association for Pattern Recognition DAGM (Deutsche Arbeitsgemeinschaft für Mustererkennung DAGM e.V.) will take place at the Friedrich Schiller University of Jena on September 9-11, 2009.

It is organized by the Chair for Computer Vision of the University Jena and the Fraunhofer IOF Jena.

Topics include, but are not limited to:

  • Machine Learning and Pattern Recognition
  • Image Analysis and Computer Vision
  • Mathematical Foundations and Statistical Data Analysis
  • Applications in Natural Sciences and Engineering
  • Biomedical Data Analysis and Imaging, Biometrics

Joachim Denzler

FSU Jena

Gunther Notni

Fraunhofer IOF Jena

 

Conference

DAGM 2009
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FSU Jena
Computer Vision Chair
Fraunhofer IOF
DAGM
City Jena

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